ISO/IEC INTERNATIONAL STANDARD 19823-21 First edition 2019-05 Information technology Conformance test methods for security service crypto suites - Part 21: Crypto suite SIMON Technologies de I'information - Méthodes d'essai de conformité pour les suites cryptographiques des services de sécurité - Partie 21: Suite cryptographique SIMON Reference number IS0/IEC19823-21:2019(E) IEC Is IS0/IEC2019 IS0/IEC 19823-21:2019(E) COPYRIGHTPROTECTEDDOCUMENT @IS0/IEC2019 All rights reserved. Unless otherwise specified, or required in the context of its implementation, no part of this publication may be reproduced or utilized otherwise in any form or by any means, electronic or mechanical, including photocopying, or posting on the internet or an intranet, without prior written permission. Permission can be requested from either IsO at the address below or Iso's member body in the country of the requester. ISO copyright office CP 40i: Ch. de Blandonnet 8 CH-1214 Vernier, Geneva Phone:+4122 749 0111 Fax: +41 22 749 09 47 Email: [email protected] Website: www.iso.org Published in Switzerland ii @ IS0/IEC 2019 - All rights reserved IS0/IEC 19823-21:2019(E) Contents Page Foreword .iv Introduction 1 Scope. 1 2 Normative references 1 3 Terms, definitions, symbols and abbreviated terms 1 4 Test methods 2 4.1 General 2 4.2 By demonstration. 2 4.3 By design 2 5 Test requirements for IS0/IEC 18000-63 interrogators and tags. .2 6 Test methods with respect to IS0/IEC 29167-21 interrogators and tags .2 6.1 Test map for optional features. 2 6.2 Crypto suite requirements 3 6.2.1 General 3 6.2.2 Crypto suite requirements of IS0/IEC 29167-21:2018, Clauses 1 to 8 and Annexes A to C. 3 6.2.3 Crypto suite requirements of IS0/IEC 29167-21:2018, Clauses 9 to 12 and Annex E. ..3 6.3 Test patterns. 13 6.3.1 General. 13 6.3.2 Test_Pattern 1 14 6.3.3 Test_Pattern 2 14 6.3.4 Test_Pattern3 15 6.3.5 Test_Pattern 4 15 6.3.6 Test_Pattern 5 16 6.3.7 Test_Pattern 6 16 6.3.8 Test_Pattern 7. 17 6.3.9 Test_Pattern 8. 17 6.3.10 Test_Pattern 9. 18 6.3.11 Test_Pattern 10 18 6.3.12 Test_Pattern 11. 19 Bibliography .20 @ IS0/IEC 2019 - All rights reserved ii