ISO INTERNATIONAL STANDARD 15625 First edition 2014-05-01 Silk Electronic test method for defects and evenness of raw silk Soie - Meéthode d'essai électronique pour les défauts et la regularité de la soie brute Reference number IS0 15625:2014(E) LSO IS02014 y IHS under lic Not for Resale IS0 15625:2014(E) COPYRIGHTPROTECTEDDOCUMENT @ IS0 2014 All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized otherwise in any form or by any means, electronic or mechanical, including photocopying, or posting on the internet or an intranet, without prior written permission. Permission can be requested from either ISO at the address below or ISO's member body in the country of the requester. ISO copyright office Case postale 56:CH-1211 Geneva 20 Tel. + 41 22 749 01 11 Fax + 41 22 749 09 47 E-mail [email protected] Web www.iso.org Published in Switzerland @ IS0 2014 - All rights reserved No reproductic networking permited without license from IHS Not for Resale IS0 15625:2014(E) Contents Page Foreword ..iv Introduction. ..V 1 Scope. ..1 2 Normative references ..1 3 Terms and definitions 4 Principle ..2 5 Apparatus ..2 6 Atmospheres for conditioning and testing. ..3 7 Lot formation and sampling .3 7.1 Lotformation ..3 7.2 Sampling.. .3 8 Laboratory sample preparation .4 8.1 Raw silk in skein. ..4 8.2 Raw silk on cone .4 8.3 Soaked silk .4 8.4 Sampling length. .4 Setting ..4 9.1 Setting of the apparatus .4 9.2 Setting of the testing parameters of defects ..5 10 Test procedure .5 11 Calculation and expression of test results .5 12 Precision ..6 13 Test report ..6 Annex A (normative) Defect counting and classification 7 Annex B (informative) Difference between the optical and capacitive sensors in detecting defects ofrawsilk 9 Annex C (normative) Method for preparing soaked raw silk in lab ..10 Annex D (informative) An example of the electronic testing result sheet ..12 Annex E (informative) Testing precision ..13 Bibliography .15 iii thout license from IHS Not for Resale
ISO 15625 2014 Silk — Electronic test method for defects and evenness of raw silk